NI PXI-2529
NI PXI-2529
NI PXI-2529
NI PXI-2529
NI PXI-2529

NI PXI-2529 | PXI Matrix Switch Module

  • Brand:​ National Instruments
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    Model:​ PXI-2529
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    Product Type:​ PXI Matrix Switch Module
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    Series:​ PXI Switch
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    Core Function:​ Provides a 4-wire 16×16 cross-point matrix for signal routing in automated test systems.
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    Key Specs:​ 16×16 matrix, 4-wire multiplexing, 300V switching capability, 1A carry current.
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Part number: NI PXI-2529
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Description

PXI-2529: Product Overview
The National Instruments PXI-2529 is a 4-wire 16×16 cross-point matrix switch module designed for PXI-based automated test systems. This module functions as a programmable signal router, enabling flexible connection between multiple sources and measurement instruments in test and measurement applications. The matrix configuration allows any input channel to be connected to any output channel, providing complete routing flexibility for complex test systems.
The module operates by using solid-state relays to establish connections between rows and columns in a matrix configuration. Each cross-point in the 16×16 matrix can be independently controlled, allowing multiple simultaneous connections between different input and output pairs. The 4-wire (quad-pole) switching capability makes it suitable for applications requiring guarded or low-leakage measurements, such as sensitive analog signals or resistance measurements. The module is software-configurable through National Instruments’ switch executive software, which simplifies the programming of complex signal routing patterns.

NI PXI-2529

NI PXI-2529

PXI-2529: Technical Specifications
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    Model Number:​ PXI-2529
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    Manufacturer:​ National Instruments
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    Product Type:​ PXI Matrix Switch Module
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    Matrix Configuration:​ 16×16 cross-point matrix
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    Switching Type:​ 4-wire (quad-pole) multiplexing
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    Maximum Voltage:​ 300V channel-to-channel
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    Carry Current:​ 1A maximum
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    Switching Speed:​ 1ms typical (including settle time)
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    Contact Life:​ 100 million operations minimum
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    On-Resistance:​ <2Ω typical
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    Off-Isolation:​ >90dB at 1MHz
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    Crosstalk:​ >90dB at 1MHz
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    Bandwidth:​ DC to 200MHz
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    Relay Type:​ Solid-state relays
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    Control Interface:​ PXI trigger lines
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    Operating Temperature:​ 0°C to 55°C
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    Storage Temperature:​ -40°C to 85°C

    NI PXI-2529

    NI PXI-2529

Core Features & Customer Value
The PXI-2529 provides significant value through its high-density matrix configuration​ and 4-wire switching capability. The 16×16 matrix architecture allows a single module to replace multiple individual switches or multiplexers, reducing system size and complexity. For test system engineers, this means fewer modules are required to achieve the same functionality, resulting in lower system cost and improved reliability.
The 4-wire switching capability​ is particularly valuable for precision measurements where lead resistance compensation is critical. This feature enables true Kelvin (4-wire) resistance measurements and guarded signal routing, which is essential for applications requiring high measurement accuracy. The solid-state relay technology​ provides fast switching speeds and long operational life compared to electromechanical relays, making the module suitable for high-throughput production test systems.
The module’s software-programmable architecture​ allows for dynamic reconfiguration of signal paths during test execution, enabling complex test sequences without manual intervention. Integration with National Instruments’ Switch Executive software further simplifies system development by providing visual routing configuration and automatic path optimization.
Typical Applications
In semiconductor test systems, the PXI-2529 routes signals between parametric measurement units and device under test pins for characterization and validation.
In aerospace and defense applications, the module switches between multiple sensors and data acquisition systems for structural health monitoring and component testing.
For communication system testing, the matrix routes RF signals between various test instruments and devices under test for comprehensive performance validation.

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