NI PXIe-2524

Description

NI PXIe-2524 Product Description

Detailed parameter table

NI PXIe-2524

Product introduction

The National Instruments PXIe-2524 is a high-performance PXI Express RF multiplexer module designed to enable flexible signal routing in high-frequency test and measurement systems. As part of NI’s PXIe switch family, it combines 32 channels of single-pole, double-throw (SPDT) relays with a broad frequency range of DC to 6 GHz, making it ideal for applications requiring precise control over RF signals in aerospace, defense, and wireless communication testing.

The PXIe-2524 integrates seamlessly into PXIe chassis, leveraging the high-speed backplane for rapid command execution and synchronization with other instruments like signal generators and analyzers. Its SMA connectors ensure reliable signal integrity, while latching relays reduce power consumption during steady-state operation. Whether configured as a 32×1 multiplexer, multiple independent banks, or a matrix, the PXIe-2524 delivers the versatility needed to streamline complex RF test setups, reducing system size and improving test throughput.

Core advantages and technical highlights

Broad frequency coverage

The NI PXIe-2524 supports signals from DC to 6 GHz, addressing the needs of modern RF systems operating in bands up to 5G and beyond. This wide range eliminates the need for multiple modules in mixed-frequency test environments, simplifying system architecture while maintaining performance across diverse applications—from baseband signal routing to millimeter-wave precursor testing.

Low signal degradation

With insertion loss as low as 1.2 dB at 1 GHz and VSWR below 2.0:1 at 6 GHz, the PXIe-2524 minimizes signal distortion, ensuring accurate measurements even at high frequencies. This is critical in radar and satellite testing, where signal integrity directly impacts the validity of test results, such as range accuracy or modulation quality.

High-density integration

Packing 32 channels into a single PXIe slot, the PXIe-2524 maximizes channel count without expanding chassis footprint. This density is invaluable in production test environments, where space constraints and high throughput demand compact, multi-channel solutions. Latching relays further enhance efficiency by consuming power only during switching, reducing heat buildup in densely packed systems.

Precise synchronization

The PXIe-2524 leverages the PXIe backplane and dedicated trigger lines to synchronize switching with other instruments, achieving sub-microsecond timing alignment. This capability is essential in phased-array antenna testing, where coordinated signal routing across multiple modules ensures accurate beamforming measurements.

Typical application scenarios

In 5G device testing, the NI PXIe-2524 routes RF signals between a device under test (DUT) and multiple test instruments, such as vector network analyzers and power meters. Its 6 GHz range covers sub-6 GHz 5G bands, enabling automated testing of transceivers for parameters like output power and modulation quality. By quickly reconfiguring signal paths, the PXIe-2524 reduces test times for high-volume production lines.

In aerospace and defense, the PXIe-2524 supports radar system validation by switching between antenna elements and test equipment. Its low insertion loss ensures minimal impact on sensitive radar signals, while its rugged design withstands the harsh operating conditions of lab and field testing. For satellite communication systems, the module routes signals between transponders and ground-based test gear, verifying performance across frequency bands up to 6 GHz.

Related model recommendations

PXIe-5663E: A 6.7 GHz vector signal analyzer that pairs with the PXIe-2524 to analyze RF signals after routing, creating a complete test solution for wireless device characterization.

PXIe-5673E: A 6 GHz vector signal generator that integrates with the PXIe-2524 to source and route calibrated signals, ideal for receiver sensitivity testing.

PXIe-2593: A higher-frequency (up to 26.5 GHz) RF switch module, serving as an upgrade to the PXIe-2524 for millimeter-wave applications like 5G FR2 testing.

PXIe-1082: An 8-slot PXIe chassis that houses the PXIe-2524 and other instruments, providing a compact platform for integrated test systems.

PXIe-6674T: A timing and synchronization module that enhances the PXIe-2524’s capabilities by distributing precision clocks across multi-module setups, ensuring coherent switching.

Installation, commissioning and maintenance instructions

Installation preparation

Before installing the NI PXIe-2524, ensure the PXIe chassis is powered off and properly grounded. Use an anti-static wristband to handle the module, avoiding contact with connector pins. Verify the chassis has an available x1 Gen 2 slot and sufficient power (≥3.3 V at 1.2 A and +12 V at 0.8 A). Prepare SMA cables rated for 6 GHz, and inspect connectors for damage. Mount the module in the chassis, securing it with front-panel screws, then connect signal and trigger cables—tightening SMA connectors to 8 in-lbs (0.9 Nm) to prevent signal loss.

Maintenance suggestions

Regularly inspect SMA connectors for corrosion or debris; clean with isopropyl alcohol and a lint-free cloth if needed. Monitor relay operation via NI Switch Executive software to detect sticking or slow responses, which may indicate wear. Avoid exceeding the 6 GHz frequency limit to prevent signal degradation. For long-term storage, power the module quarterly to exercise relays and prevent contact oxidation. If relays require replacement, use only NI-certified parts to maintain performance specifications. Keep the module within operating temperature ranges to avoid thermal stress on components.

Service and guarantee commitment

The NI PXIe-2524 is backed by a 3-year standard warranty, covering defects in materials and workmanship. NI’s global technical support team provides expert assistance for installation, configuration, and troubleshooting via phone, email, and online resources. Calibration services, accredited to ISO 17025, ensure traceability to international standards, with options for on-site or factory calibration.

NI’s commitment to quality ensures the PXIe-2524 meets rigorous reliability standards, with a mean time between failures (MTBF) exceeding 100,000 hours. For custom integration needs, NI offers professional services to optimize system performance, ensuring the PXIe-2524 delivers consistent results in even the most demanding RF test environments.