NI PXI-2531
NI PXI-2531
NI PXI-2531
NI PXI-2531
NI PXI-2531

NI PXIe-2737 | PXI Express Matrix Switch Module

  • Brand:​ National Instruments
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    Model:​ PXIe-2737
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    Product Type:​ PXI Express Matrix Switch Module
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    Series:​ PXI Express
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    Core Function:​ Provides high-frequency signal routing for RF and microwave test systems.
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    Key Specs:​ 4×4 matrix configuration, DC to 26.5 GHz bandwidth, 50Ω impedance.
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Part number: NI PXIe-2737
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Description

PXIe-2737: Product Overview
The National Instruments PXIe-2737 is a high-frequency matrix switch module designed for PXI Express-based RF and microwave test systems. This module provides a 4×4 cross-point matrix configuration capable of handling signals from DC to 26.5 GHz, making it suitable for routing high-frequency signals between test instruments and devices under test. The module serves as a critical component in automated test systems where multiple RF sources and measurement instruments need to be shared across multiple test ports.
The module utilizes electromechanical coaxial relays to maintain signal integrity at high frequencies. Each of the 16 cross-points can be independently controlled, allowing flexible signal routing configurations. The 50Ω impedance matching throughout the signal path minimizes reflections and ensures accurate signal transmission. The matrix is particularly valuable in systems testing wireless devices, RF components, and microwave subsystems where signal integrity and bandwidth are critical parameters.

NI PXI-2531

NI PXI-2531

PXIe-2737: Technical Specifications
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    Model Number:​ PXIe-2737
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    Manufacturer:​ National Instruments
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    Product Type:​ PXI Express Matrix Switch Module
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    Matrix Configuration:​ 4×4 cross-point matrix
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    Frequency Range:​ DC to 26.5 GHz
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    Impedance:​ 50Ω nominal
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    Insertion Loss:​ <3.0 dB at 26.5 GHz
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    VSWR:​ <2.0:1 at 26.5 GHz
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    Isolation:​ >60 dB at 26.5 GHz
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    Maximum RF Power:​ 33 dBm (2 W) at 25°C
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    Relay Type:​ Electromechanical coaxial relays
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    Connector Type:​ 3.5 mm female
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    Switching Speed:​ <30 ms
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    Operational Life:​ 1,000,000 cycles minimum
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    Control Interface:​ PXI Express
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    Operating Temperature:​ 0°C to 55°C

    NI PXI-2531

    NI PXI-2531

Core Features & Customer Value
The PXIe-2737 delivers significant value through its high-frequency capability and matrix flexibility. The DC to 26.5 GHz bandwidth supports a wide range of RF and microwave applications, from baseband signals to Ka-band frequencies. The 4×4 matrix configuration enables efficient sharing of expensive test equipment, such as vector network analyzers and signal generators, across multiple devices under test, substantially reducing the cost per test in high-volume production environments.
The module’s excellent RF performance characteristics, including low insertion loss and high isolation, ensure accurate measurements by minimizing signal degradation and crosstalk. The 3.5 mm connector interface​ provides reliable connections while supporting measurements up to 26.5 GHz. The electromechanical relay technology​ offers superior RF performance compared to solid-state alternatives, with lower insertion loss and higher power handling capability, though with slower switching speed.
Integration with the PXI Express platform​ provides high-speed communication with the system controller, enabling rapid reconfiguration between test sequences. The module can be synchronized with other PXI Express instruments using the timing and triggering capabilities of the platform, supporting complex multi-instrument test scenarios.
Typical Applications
In wireless device production test, the matrix routes signals between a vector network analyzer and multiple device test ports for parallel S-parameter measurements on RF front-end components.
In aerospace and defense systems, the module switches between multiple antenna elements and test equipment for phased array antenna characterization and radar system testing.
For semiconductor test applications, the matrix connects RF test instruments to multiple wafer probe cards for high-frequency parameter analysis of integrated circuits.

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