NI PXI-2533
NI PXI-2533

NI PXI-2533 | PXI Matrix Switch Module

  • Brand:​ National Instruments
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    Model:​ PXI-2533
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    Product Type:​ PXI Matrix Switch Module
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    Series:​ PXI Switch
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    Core Function:​ High-density signal routing with 256 crosspoints using solid-state relay technology.
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    Key Specs:​ 4×64 matrix configuration, 1-wire switching, ±55 VDC/30 VACrms, 1A current, 55W power handling.
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Part number: NI PXI-2533
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Description

PXI-2533: Product Overview
The National Instruments PXI-2533 is a high-density PXI matrix switch module designed for automated test systems requiring extensive signal routing capabilities. This module features 256 crosspoints arranged in a 4×64 matrix configuration, providing flexible signal routing between multiple sources and measurement instruments. The module utilizes solid-state relay (SSR) technology, offering unique advantages such as unlimited mechanical lifetime and the ability to simultaneously route 55W on all channels
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The PXI-2533 is configured as a 1-wire matrix, making it ideal for general-purpose signal routing applications where high channel density and reliability are critical requirements. The module includes onboard relay counting for monitoring relay operations and supports deterministic operation through hardware triggers, significantly improving test throughput in automated test environments

NI PXI-2533

NI PXI-2533

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PXI-2533: Technical Specifications
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    Model Number:​ PXI-2533 (Part Number: 778572-33)
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    Manufacturer:​ National Instruments
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    Product Type:​ PXI Matrix Switch Module
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    Matrix Configuration:​ 4×64 (1-wire)
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    Crosspoints:​ 256
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    Maximum Switching Voltage:​ ±55 VDC, 30 VACrms
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    Maximum Switching Current:​ 1 A
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    Maximum Switching Power:​ 55 W
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    DC Isolation Resistance:​ >2 GΩ typical
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    Total Path Resistance:​ 1 Ω typical (row-to-column)
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    Offset Voltage:​ 2 µV typical
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    Switching Bandwidth:​ >1.5 MHz typical (50 Ω system)
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    Relay Type:​ Solid-state relay (SSR)
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    Switching Speed:​ 724 µs typical, 2.5 ms maximum
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    Scan Rate:​ 400 crosspoints/s
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    Connector:​ 68-pin male SCSI
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    Power Consumption:​ 8W at 5V, 1W at 3.3V typical
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    Operating Temperature:​ 0°C to 55°C
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    Dimensions:​ 21.6 × 2.0 × 13.0 cm (3U, single-slot PXI)
Core Features & Customer Value
The PXI-2533 delivers exceptional value through its solid-state relay technology​ and high channel density. The SSR technology provides unlimited mechanical lifetime, eliminating concerns about relay wear-out in high-throughput production test environments. This reliability ensures consistent performance over extended operational periods without the need for maintenance or replacement
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The 256 crosspoint configuration​ enables a single module to replace multiple smaller switching modules, reducing system complexity and cost. The 4×64 matrix architecture allows flexible signal routing between multiple instruments and test points, making it ideal for applications requiring shared instrumentation across numerous test channels. The onboard relay counting​ feature enables monitoring of relay operations, providing valuable diagnostic information for system health monitoring and preventive maintenance
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The module’s hardware triggering capabilities​ support deterministic operation, enabling precise timing synchronization with other PXI instruments. This feature is particularly valuable in applications requiring coordinated measurements across multiple channels or instruments. The high switching speed​ (724 µs typical) ensures rapid signal routing, minimizing test time in high-throughput production environments
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Typical Applications
In semiconductor test systems, the PXI-2533 routes signals between parametric measurement units and multiple device pins for characterization and production testing of integrated circuits.
For automotive electronics testing, the module switches between multiple sensors and control units, enabling comprehensive functional testing of electronic control units (ECUs) and sensor interfaces.
In aerospace and defense applications, the matrix connects multiple test instruments to various subsystems, supporting structural health monitoring and component validation testing.
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