PXI-5124: Product OverviewThe National Instruments PXI-5124 is a high-resolution digitizer module designed for the PXI platform, serving as a sophisticated data acquisition instrument for applications requiring precise time-domain and frequency-domain analysis. This module functions as a dual-channel digital oscilloscope within an automated test system, capturing analog signals with high fidelity for detailed examination and processing. Its primary role is to digitize analog waveforms from sensors, transducers, and circuit nodes with greater accuracy than standard 8-bit measurement systems.Installed in a PXI chassis, the module operates by simultaneously sampling two input channels using independent analog-to-digital converters, ensuring precise timing alignment between channels. This capability is critical for applications requiring phase relationship analysis, such as power analysis and transfer function measurements. The module is engineered to handle a wide range of signal amplitudes with its software-selectable input ranges, making it suitable for both low-level sensor signals and higher-voltage system monitoring. The architecture includes significant onboard memory per channel, allowing for extended data capture windows at high sampling rates to characterize transient events or long-duration waveforms accurately.PXI-5124: Technical Specifications
• Model Number: PXI-5124
• Manufacturer: National Instruments
• Product Type: PXI Digitizer Module
• Number of Channels: 2 simultaneously sampled channels
• Maximum Sampling Rate: 200 MS/s per channel
• Resolution: 12 bits
• Bandwidth: 150 MHz (-3 dB)
• Input Ranges: Software-selectable, from ±0.1 V to ±40 V full scale
Core Features & Customer ValueHigh-Resolution Signal Acquisition: The 12-bit analog-to-digital converter provides 4,096 discrete quantization levels, which is 16 times the resolution of conventional 8-bit oscilloscopes. For engineers, this translates to significantly improved measurement accuracy for small signal variations and enhanced dynamic range. This is particularly valuable for applications like harmonic analysis, noise measurement, and characterizing low-amplitude signals where fine detail is critical. The higher resolution reduces quantization error, providing a more accurate representation of the true analog signal.Deep Memory and Flexible Sampling: The substantial onboard memory per channel allows for long record lengths at the maximum sampling rate. This enables the capture of complex signal sequences or transient events without gaps. The benefit to system integrators is the ability to perform detailed post-processing on acquired data, such as zooming in on specific portions of a long acquisition or analyzing the characteristics of infrequent events. The flexible sampling architecture allows users to optimize the trade-off between acquisition time and time resolution based on specific measurement needs.Advanced Triggering and Synchronization: The module supports sophisticated triggering options beyond simple edge triggering, including window and video triggering. This capability allows engineers to isolate specific signal events of interest efficiently, saving acquisition memory and processing time. The synchronization features via the PXI backplane enable precise time alignment with other instruments in the chassis, which is essential for multi-instrument test systems requiring correlated measurements across different signal types.Typical ApplicationsIn power electronics analysis, the module is used to characterize switching power supplies and motor drives, capturing voltage and current waveforms with high resolution to accurately measure rise times, settling times, and harmonic content for efficiency calculations and EMI diagnostics.For communications system validation, the digitizer analyzes modulated RF signals at intermediate frequencies (IF), providing the high-fidelity data needed for measuring modulation accuracy, error vector magnitude (EVM), and adjacent channel power ratio (ACPR).In structural dynamics and vibration testing, the module acquires data from accelerometers and strain gauges, where its high resolution is critical for identifying small-amplitude vibrations and modal patterns in mechanical systems.
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