NI PXIe-4132

Dual Independent Channels for Parallel Testing

Unlike the single-channel PXIe-4112, the PXIe-4132 features 2 fully independent channels, each capable of sourcing and measuring voltage/current without cross-talk. This allows simultaneous testing of two devices—for example, characterizing two MOSFETs in parallel during production testing—doubling throughput and reducing test cycle time. Each channel includes its own 4-wire sensing terminals, ensuring measurement accuracy is maintained even when both channels are active.

Extended Power and Current Capability

With DC current up to ±3 A (6x the PXIe-4112’s DC current) and pulsed current up to ±10 A (over 3x the pulsed capability of the PXIe-4112), the PXIe-4132 handles high-power devices such as IGBTs, power diodes, and lithium-ion battery cells. Its 60 W DC power per channel (3x the PXIe-4112’s DC power) and 200 W pulsed power enable stress testing, where devices are subjected to extreme conditions to validate reliability. For example, it can discharge a battery cell at 10 A to simulate high-load scenarios in electric vehicles.

Superior Accuracy and Resolution

The PXIe-4132 improves on the PXIe-4112’s precision with 18-bit resolution (2 bits higher) for both voltage and current, and tighter accuracy specifications: ±(0.01% of reading + 0.003% of range) for voltage and ±(0.015% of reading + 0.005% of range) for current. This makes it ideal for low-level measurements, such as leakage currents in microampere or nanoampere ranges for precision sensors. The 4-wire resistance measurement mode minimizes lead errors, critical for characterizing high-precision resistors or superconductors.

Advanced Sweeping and Sequencing

Beyond basic sweeps, the PXIe-4132 supports segmentable sweep sequences with programmable transitions, allowing complex test profiles. For example, it can perform a voltage sweep from 0 V to 20 V, pause to measure capacitance, then execute a current sweep from 0 A to 3 A—all in a single automated sequence. This capability is invaluable for characterizing devices with non-linear behavior, such as lithium-ion batteries, where charge/discharge profiles involve multiple stages.

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Part number: NI PXIe-4132
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Description

NI PXIe-4132 Product Description

Detailed Parameter Table

Parameter Name Parameter Value
Product Model PXIe-4132
Manufacturer National Instruments
Product Category PXIe Source Measure Unit (SMU)
Form Factor 3U PXIe
Slot Requirement 1 PXIe slot
Channels 2 independent channels
Voltage Range ±20 V
Current Range ±3 A (DC), ±10 A (pulsed)
Voltage Resolution 18 bits
Current Resolution 18 bits
Voltage Accuracy ±(0.01% of reading + 0.003% of range)
Current Accuracy ±(0.015% of reading + 0.005% of range)
Maximum Power 60 W (DC per channel), 200 W (pulsed per channel)
Measurement Modes Voltage, current, resistance (4-wire), power, capacitance
Sweep Capabilities Voltage, current, power sweeps with programmable points, timing, and segmentable sequences
Compliance Protection Voltage and current compliance limits with configurable response times
Interface PXIe 3.0 (x4 lane)
Operating Temperature 0 °C to 55 °C
Storage Temperature -40 °C to 70 °C
Humidity Range 5% to 95% non-condensing
Dimensions 100 mm (width) x 160 mm (depth) x 37 mm (height)
Weight 420 g
Compliance Standards CE, UL, CSA, FCC Part 15 Class A
Software Compatibility LabVIEW, LabWindows/CVI, .NET, C/C++, NI-DCPower
NI PXIe-4132

NI PXIe-4132

Product Introduction

The NI PXIe-4132 is an advanced 3U PXIe Source Measure Unit (SMU) designed to deliver higher power, increased channel count, and enhanced precision for demanding electronic testing applications. Building on the capabilities of the PXIe-4112, this module targets medium to high-power device characterization, including power semiconductors, batteries, and industrial sensors.

As a key component in National Instruments’ high-performance PXIe ecosystem, the PXIe-4132 integrates seamlessly with chassis like the PXIe-1073, leveraging the x4 lane PXIe 3.0 interface for ultra-fast data transfer and synchronization with modules such as the PXI-6608 counter/timer and PXI-2510 switch. Its dual independent channels enable parallel testing, doubling throughput in production environments, while its expanded current range and higher resolution make it suitable for both low-level sensor calibration and high-power device stress testing. Whether deployed in automotive electronics testing or energy storage research, the PXIe-4132 sets a new standard for versatility in modular SMUs.

Core Advantages and Technical Highlights

Dual Independent Channels for Parallel Testing

Unlike the single-channel PXIe-4112, the PXIe-4132 features 2 fully independent channels, each capable of sourcing and measuring voltage/current without cross-talk. This allows simultaneous testing of two devices—for example, characterizing two MOSFETs in parallel during production testing—doubling throughput and reducing test cycle time. Each channel includes its own 4-wire sensing terminals, ensuring measurement accuracy is maintained even when both channels are active.

Extended Power and Current Capability

With DC current up to ±3 A (6x the PXIe-4112’s DC current) and pulsed current up to ±10 A (over 3x the pulsed capability of the PXIe-4112), the PXIe-4132 handles high-power devices such as IGBTs, power diodes, and lithium-ion battery cells. Its 60 W DC power per channel (3x the PXIe-4112’s DC power) and 200 W pulsed power enable stress testing, where devices are subjected to extreme conditions to validate reliability. For example, it can discharge a battery cell at 10 A to simulate high-load scenarios in electric vehicles.

Superior Accuracy and Resolution

The PXIe-4132 improves on the PXIe-4112’s precision with 18-bit resolution (2 bits higher) for both voltage and current, and tighter accuracy specifications: ±(0.01% of reading + 0.003% of range) for voltage and ±(0.015% of reading + 0.005% of range) for current. This makes it ideal for low-level measurements, such as leakage currents in microampere or nanoampere ranges for precision sensors. The 4-wire resistance measurement mode minimizes lead errors, critical for characterizing high-precision resistors or superconductors.

Advanced Sweeping and Sequencing

Beyond basic sweeps, the PXIe-4132 supports segmentable sweep sequences with programmable transitions, allowing complex test profiles. For example, it can perform a voltage sweep from 0 V to 20 V, pause to measure capacitance, then execute a current sweep from 0 A to 3 A—all in a single automated sequence. This capability is invaluable for characterizing devices with non-linear behavior, such as lithium-ion batteries, where charge/discharge profiles involve multiple stages.

Typical Application Scenarios

Power Semiconductor Testing

In automotive and industrial electronics, the PXIe-4132 characterizes power devices like IGBTs and SiC MOSFETs. Its dual channels test two devices in parallel, measuring parameters such as on-resistance (RDS(on)), breakdown voltage (BVDS), and switching losses. The pulsed current capability simulates high-load conditions without overheating the device, ensuring accurate characterization of dynamic performance.

Battery and Energy Storage Testing

The module is ideal for testing battery cells and energy storage systems. It can charge/discharge cells at currents up to 10 A (pulsed) to evaluate capacity, cycle life, and internal resistance. The dual channels allow comparing two cells under identical conditions, accelerating research into battery chemistry improvements. When paired with the PXI-8461 CAN module, it integrates with battery management systems (BMS) to validate communication and control logic during charging.

Industrial Sensor and Actuator Testing

For industrial sensors (e.g., pressure transducers) and actuators (e.g., solenoids), the PXIe-4132 provides precise excitation and measurement. It can source a 24 V signal to a solenoid and measure the inrush current to verify operation, or calibrate a pressure sensor by applying known currents and measuring voltage output. The high resolution ensures accurate calibration of sensors with microvolt-level outputs.

Related Model Recommendations

NI PXIe-1073: A 14-slot PXIe chassis that accommodates the PXIe-4132 and supporting modules, with a high-power backplane to supply the SMU’s increased current demands.

NI PXI-8186: A PXI controller that manages the PXIe-4132, processing dual-channel data in real time and executing complex test sequences via LabVIEW.

NI PXI-2510: A matrix switch module that expands the PXIe-4132’s testing capacity, routing its two channels to multiple DUTs for high-throughput production testing.

NI PXI-6608: A counter/timer module that synchronizes the PXIe-4132’s sweep timing with other instruments, ensuring precise coordination in multi-module test systems.

NI-DCPower with Advanced Sequencing: Software that unlocks the PXIe-4132’s segmentable sweep capabilities, enabling custom test profiles for complex devices.

Installation, Commissioning, and Maintenance

Installation Steps

Module Insertion: Power off the PXIe chassis (e.g., PXIe-1073). Insert the PXIe-4132 into a PXIe slot, ensuring full engagement with the backplane. Secure with front-panel screws to handle the module’s higher weight and power.

Connections: Use high-current test leads for channels operating above 1 A to minimize voltage drop. For 4-wire measurements, connect sense leads directly to the DUT terminals to bypass lead resistance. Use separate cables for each channel to prevent interference.

Software Setup: Install the latest NI-DCPower drivers on the PXI controller. Use NI MAX to configure channel-specific settings (e.g., current limits, compliance) and verify communication via the x4 lane PXIe interface.

Commissioning

Accuracy Verification: Use a calibrated high-power reference (e.g., 10 A current shunt, 20 V precision source) to validate each channel. For example, source 3 A DC and confirm the measured current is within ±(0.015% of reading + 0.005% of range).

Pulsed Operation Test: Configure a 10 A, 100 ms pulse and measure it with an oscilloscope to verify pulse shape, amplitude, and timing. Ensure the module transitions smoothly between pulsed and DC modes.

Dual-Channel Synchronization: Run simultaneous sweeps on both channels with a common trigger (via PXI-6608) and verify that timing offsets are less than 1 µs, critical for parallel testing accuracy.

Maintenance Tips

High-Current Terminal Care: Inspect terminal blocks regularly for signs of overheating (discoloration) or corrosion, especially after high-power operation. Tighten connections to maintain low contact resistance.

Calibration: Calibrate annually using NI’s high-power calibration services, which include verification of pulsed current accuracy—critical for the PXIe-4132’s extended range.

Thermal Management: Ensure the PXIe chassis has adequate cooling (≥200 CFM fan flow) to dissipate heat from 60 W DC operation. Monitor channel temperatures via software and reduce load if exceeding 50 °C.

Overload Protection: Configure hardware fuses in external test leads for currents above 3 A, complementing the module’s software compliance limits. Test fault recovery by intentionally triggering an overload and verifying the module shuts down safely.

Service and Guarantee Commitment

The NI PXIe-4132 includes a 2-year warranty covering defects in materials and workmanship, with optional 3- or 5-year extensions. National Instruments’ technical support team provides specialized assistance for high-power applications, including pulsed operation and dual-channel synchronization.

NI offers accredited calibration with traceability to NIST, including verification of pulsed current and high-voltage accuracy. Repair services include component-level fixes for power circuitry, ensuring the module maintains performance in demanding environments. Backed by NI’s expertise in high-power test systems, the PXIe-4132 delivers reliable performance for the most challenging source-measure applications.

 

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