NI PXIE-5172

Description

Detailed parameter table

NI PXIE-5172

Product introduction

The NI PXIe-5172 is a high-speed digitizer module developed by National Instruments (NI), a pioneer in modular test and measurement technology. As a flagship product in NI’s PXIe digitizer lineup—renowned for high performance and scalability—the NI PXIe-5172 is engineered to address the most demanding signal acquisition needs in aerospace, defense, and high-speed electronics testing.

Designed for engineers and researchers working with ultra-fast signals, the NI PXIe-5172 delivers 2 GS/s simultaneous sampling across 2 differential channels, paired with 12-bit vertical resolution and 500 MHz bandwidth. Unlike standalone oscilloscopes, its 3U PXIe form factor enables seamless integration into modular test systems, where it can be combined with other PXIe modules (e.g., signal generators, switches) to create custom, high-throughput test solutions.

At its core, the NI PXIe-5172 merges lab-grade measurement precision with industrial ruggedness. Powered by NI’s NI-DAQmx and NI-SCOPE drivers, it supports advanced signal processing (such as real-time FFT) and multi-module synchronization—critical for applications like radar signal analysis, semiconductor testing, and optical communication characterization. Whether deployed in a production test floor or a research lab, the NI PXIe-5172 ensures reliable capture of fast transient signals, while its modular design future-proofs test systems for evolving requirements.

Core advantages and technical highlights

Ultra-high sampling rate and bandwidth

The NI PXIe-5172 excels at capturing ultra-fast signals with its 2 GS/s sampling rate and 500 MHz bandwidth. For example, in radar systems testing, it can accurately digitize pulsed radar signals with nanosecond-level pulse widths, preserving critical details like rise time and pulse shape. The 12-bit vertical resolution ensures precise differentiation between small signal variations—essential for analyzing low-amplitude noise in high-speed digital circuits (e.g., 5G transceiver components). This combination of speed and precision makes the NI PXIe-5172 a top choice for testing next-generation electronics.

Modular scalability and system integration

As a PXIe module, the NI PXIe-5172 offers unmatched scalability. It can be installed in any NI PXIe chassis (e.g., NI PXIe-1085) and combined with other PXIe modules—such as NI PXIe-5450 signal generators or NI PXIe-2596 switches—to build comprehensive test systems. For instance, in semiconductor manufacturing, a system with multiple NI PXIe-5172 modules can simultaneously test multiple high-speed I/O ports on a single chip, reducing test time by 50% compared to single-instrument setups. The PXIe x4 lane interface also ensures high-bandwidth data transfer (up to 1 GB/s), enabling real-time streaming of large datasets to host PCs or on-board storage.

Advanced triggering and synchronization

The NI PXIe-5172 features a robust triggering system that supports edge, pulse width, pattern, and advanced serial pattern triggering. This versatility lets users isolate specific events—like glitches in power supply signals or specific data packets in serial communications (e.g., PCIe 5.0). Additionally, its support for PXIe Trigger Bus and Clock Sync enables synchronization of multiple NI PXIe-5172 modules (or other PXIe instruments) with sub-nanosecond accuracy. In aerospace applications, this synchronization is critical for testing multi-channel sensor arrays, where timing alignment between channels directly impacts measurement validity.

On-board processing and long-term accuracy

To reduce host PC workload, the NI PXIe-5172 includes on-board signal processing capabilities, such as real-time FFT, filtering, and peak detection. For example, in optical communication testing, it can compute frequency-domain data (e.g., signal-to-noise ratio) directly on the module, eliminating latency associated with data transfer to a PC. The module also integrates calibration circuitry, which automatically corrects for gain and offset errors over time and temperature. This ensures measurement accuracy for years—critical for production test environments where consistent results are required to meet quality standards.

NI PXIE-5172

Typical application scenarios

Aerospace and defense testing

In aerospace and defense, the NI PXIe-5172 is used to test radar, sonar, and communication systems. For instance, when validating a pulsed Doppler radar, the module captures radar return signals (with 2 GS/s sampling) to analyze pulse repetition frequency, pulse width, and target reflection characteristics. Its high bandwidth (500 MHz) also enables testing of satellite communication transceivers, where it digitizes high-frequency RF signals (up to 500 MHz) to verify signal integrity and compliance with industry standards. The NI PXIe-5172’s rugged design and multi-module synchronization further make it suitable for flight test environments, where it can be deployed in compact test enclosures to monitor in-flight sensor data.

Semiconductor and electronics manufacturing

In semiconductor testing, the NI PXIe-5172 is a key tool for validating high-speed digital chips (e.g., CPUs, FPGAs) and RF components. For example, when testing a 5G baseband chip, the module captures output signals from the chip’s high-speed I/O ports (e.g., 10 Gbps Ethernet) to measure jitter, eye diagram, and signal-to-noise ratio. Its 1 GB per channel memory depth lets users record long signal sequences—essential for identifying intermittent faults in chip operation. When integrated into a production test system with PXIe switches, the NI PXIe-5172 can test multiple chips in parallel, increasing throughput and reducing manufacturing costs.

Optical communication characterization

In optical communication labs, the NI PXIe-5172 is used to characterize optical transceivers and fiber-optic systems. After converting optical signals to electrical signals via a photodetector, the module digitizes the signals at 2 GS/s to analyze key parameters like bit error rate (BER), dispersion, and polarization mode dispersion. Its on-board FFT processing enables real-time frequency-domain analysis, helping engineers optimize transceiver design for long-haul fiber links. The NI PXIe-5172’s compatibility with LabVIEW also lets users build custom dashboards to visualize eye diagrams and BER curves, streamlining the characterization process.

Related model recommendations

NI PXIe-5171

A sibling model to the NI PXIe-5172, with 1 differential channel (vs. 2) and 1 GS/s sampling rate (vs. 2 GS/s). It’s a cost-effective choice for single-channel applications (e.g., basic RF signal testing) while retaining the same 500 MHz bandwidth and 12-bit resolution as the NI PXIe-5172.

NI PXIe-5186

A high-performance upgrade to the NI PXIe-5172, offering 10 GS/s sampling rate and 2 GHz bandwidth. It’s ideal for ultra-high-speed applications (e.g., 802.11ax Wi-Fi testing, 100 Gbps Ethernet validation) where the NI PXIe-5172’s 2 GS/s rate is insufficient.

NI PXIe-5450

A arbitrary waveform generator module that complements the NI PXIe-5172. While the NI PXIe-5172 captures signals, the PXIe-5450 generates high-fidelity test signals (up to 650 MHz). Together, they form a closed-loop test system for validating transceivers, sensors, and other electronic devices.

NI PXIe-1085

A 8-slot PXIe chassis designed to host the NI PXIe-5172 and other PXIe modules. It provides a stable power supply and high-speed backplane (up to 8 GB/s) for multi-module synchronization, making it the ideal platform for building scalable test systems with the NI PXIe-5172.

NI LabVIEW 2024

Essential software for maximizing the NI PXIe-5172’s capabilities. LabVIEW lets users build custom test sequences, automate data analysis (e.g., eye diagram generation), and create user-friendly interfaces for monitoring measurements. It’s a critical tool for unlocking the module’s advanced features, such as multi-module synchronization and on-board processing.

NI PXIe-2596

A 4×4 matrix switch module that pairs with the NI PXIe-5172 for multi-channel testing. It lets users route multiple signals to the NI PXIe-5172’s inputs, eliminating the need for manual reconnection and increasing test efficiency in production environments.

Installation, commissioning and maintenance instructions

Installation preparation

Before installing the NI PXIe-5172, ensure compatibility with your PXIe chassis (e.g., NI PXIe-1085, PXIe-1075). Power off the chassis and insert the module into an empty 3U PXIe slot, ensuring it is fully seated and secured with the front-panel screws. Connect BNC cables from your signal source to the module’s analog inputs, and use the front-panel trigger connectors for external triggering if needed. Download and install the latest NI-DAQmx and NI-SCOPE drivers from NI’s website—these enable communication between the module and your PC. For multi-module setups, configure synchronization via the PXIe Trigger Bus using NI’s Measurement & Automation Explorer (MAX) software. Always wear an ESD wristband when handling the module to prevent electrostatic damage.

Maintenance suggestions

To maintain the NI PXIe-5172’s accuracy, perform annual calibration using NI’s recommended calibration procedures (or use NI’s Calibration Service for professional calibration). Clean the BNC connectors and chassis slot contacts quarterly with a dry, lint-free cloth—dust buildup can cause signal loss or connectivity issues. Avoid exposing the module to extreme temperatures or moisture (adhere to the 0 °C–55 °C operating range) to prevent component degradation. If you encounter signal distortion, check for damaged BNC cables (replace if necessary) and verify the input impedance setting (50 Ω for RF signals, 1 MΩ for low-frequency signals). For software issues, update NI-DAQmx and NI-SCOPE to the latest versions—NI regularly releases bug fixes and performance enhancements. Use only NI-certified spare parts for repairs to ensure measurement accuracy and module compatibility.

Service and guarantee commitment

National Instruments (NI) backs the NI PXIe-5172 with a 2-year standard warranty, covering defects in materials and workmanship. For extended protection, customers can purchase NI’s ServicePlus Premium plan, which extends coverage up to 5 years and includes priority technical support, on-site service, and calibration services. NI’s global technical team—specialized in high-speed digitization—is available 24/7 via phone, email, and online chat to assist with module setup, synchronization, or troubleshooting (e.g., resolving trigger issues or optimizing data throughput).

NI also provides free access to a wealth of resources: application notes on high-speed signal testing, LabVIEW example code for the NI PXIe-5172, and a user community where engineers share best practices. If a module fails within the warranty period, NI will repair or replace it at no cost, with expedited shipping to minimize downtime. This commitment reflects NI’s confidence in the NI PXIe-5172’s durability and its dedication to supporting customers in their most critical test and measurement tasks.